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CEM6881 · Scanning electron microscopy

Official Handbook

2026 Handbook0 credit pointsLevel 6Department of Materials Science and Engineering

Last checked: 23 Aug 2026 UTC

Overview

This unit is limited to those students whose research project requires scanning electron microscope (SEM) training (see rules section for details). The scanning electron microscope (SEM) is an instrument that provides the unique ability to characterise the surface of materials at micrometre and nanometre scales. This unit is designed to offer both theoretical and practical training in operating a SEM, for those who need the technique for their research. The emphasis is to arm you with the skills necessary to both effectively operate the instrument AND make meaningful conclusions regarding the results generated.

Offerings

CampusTeaching periodMode
ClaytonSecond semesterTeaching activities are on-campus (ON-CAMPUS)
ClaytonFirst semesterTeaching activities are on-campus (ON-CAMPUS)

Assessment

The Handbook does not list a final examination among the assessment items. That is not a guarantee there is none.

#AssessmentTypeWeightHurdle
1Microscope licence testQuiz / Test10%Threshold
2Microscope familiarisationDemonstration20%Threshold
3SEM theory testQuiz / Test20%Threshold
4Final reportWritten50%Threshold

Continuous assessment: 50% Final assessment: 50% Final grades: PGO (pass grade only) or NGO (fail) This unit contains threshold hurdle requirements that you must achieve to be able to pass the unit. You are required to achieve at least 45% in the total continuous assessment component and at least 45% in the final assessment component. The consequence of not achieving a hurdle requirement is a fail grade (NGO).

Assessment details may change. Please refer to the assessment information in Moodle closer to the start of the teaching period.

Requisites

The Handbook lists no prerequisite, corequisite or prohibition for this unit.

Learning outcomes

  1. Safely and independently operate a scanning electron microscope (SEM) at MCEM.
  2. Understand how to tune microscope parameters to match the information required from their specimens.
  3. Confidently be able to interpret the results from secondary electron, backscattered electron and energy dispersive X-ray data.
  4. Be able to prepare samples for loading into the instrument.

Workload

The minimum total expected workload to achieve the learning outcomes for this unit is 120 hours per semester typically comprising a mixture of scheduled learning activities, independent study and independent operation of instruments. The unit requires on average one or two hours of scheduled activities per week. Scheduled activities may include a combination of lectures, seminars, small group practical training, one-to-one practical training and online engagement. Timetables for each learner will depend on the date they commence training, the availability of experimental facilities and individual progression. Learners will be provided with timetables by teaching staff.

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